| Consumer | Education | Research |

| Testing & Certification |

 

Kristopher Davis
Research Engineer
Solar Technologies Research

Phone:	(321) 638-1012
Fax:	(321) 638-1439
Email:	Click here to contact

Education:

B.S. Electrical Engineering
University of Central Florida, Orlando, Florida 2007

M.S. Optics and Photonics
University of Central Florida, Orlando, Florida 2011

Research Focus:

Mr. Davis’s primary research interests include: photovoltaic (PV) cell and module characterization; PV materials processing and device fabrication; modeling and characterization of PV materials and devices; PV cell and module manufacturing; and the reliability and long-term performance of PV modules and systems.

Since beginning at FSEC in January 2007, Mr. Davis has provided cell and module characterization services to a number of different organizations, including module manufacturers, accredited qualification laboratories, U.S. Dept. of Energy national laboratories, NASA, and other third parties interested in understanding how these devices perform under varying environmental conditions. This work has included PV device measurements (e.g. I-V characteristics, optical properties, quantum efficiency, materials characterization), as well as module performance and reliability testing. In the area of processing and fabrication, Mr. Davis has focused on low cost manufacturing methods for advanced crystalline silicon (c-Si) cells, including the development of atmospheric-based processes that eliminate costly vacuum systems. Currently, he is the c-Si Metrology Program Manager for the U.S. Photovoltaic Manufacturing Consortium (PVMC), a U.S. Dept. of Energy funded initiative in collaboration with SEMATECH. In this capacity, Mr. Davis has been working with a number of companies across the U.S. PV supply chain to better understand the challenges facing c-Si metrology and develop solutions to these problems through collaborative R&D.

Mr. Davis is an active member of IEEE, the IEEE Electron Device Society and the IEEE Power and Energy Society. He is also a member of AVS, SPIE, and MRS.

Recent Publications:

• K.O. Davis, K. Jiang, C. Demberger, H. Zunft, H. Haverkamp, D. Habermann, W.V. Schoenfeld, “Investigation of the Internal Back Reflectance of Rear Side Dielectric Stacks for c-Si Solar Cells”, IEEE Journal of Photovoltaics, 2013. DOI: 10.1109/JPHOTOV.2012.2233861
• K.O. Davis, H. Seigneur, A. Rudack, W.V. Schoenfeld, “PVMC Tackles c-Si Metrology Challenges” Future Photovoltaics, April 2012. http://www.futurepv.com/node/389
• K.O. Davis, S. Kurtz, D. Jordan, J. Wohlgemuth, N. Hickman, “Multi-pronged strategy for determining degradation rates of photovoltaic modules and arrays from archived data sets”, Progress in Photovoltaics: Research and Applications, 2012. DOI: 10.1002/pip.2154
• A. Belay, W. Zhou, R. Krueger, K.O. Davis, U. Alver, N. Hickman, “Effect of UV-Ozone Exposure on PCBM”, IEEE Journal of Photovoltaics 2(2), pp. 148-143, 2012. DOI: 10.1109/JPHOTOV.2012.218357
• U. Alver, W. Zhou, A. B. Belay, R. Krueger, K.O. Davis, N. Hickman, “Optical and structural properties of ZnO nanorods grown on graphene oxide and reduced graphene oxide film by hydrothermal method,” Applied Surface Science 258(7), pp. 3109–3114, 2011. DOI:10.1016/j.apsusc.2011.11.046